In-Situ Metrology for Mesa-Wall Integrity in Large Format Small-Pixel Infrared Detector Array Fabrication
This RFP seeks non-destructive metrology solutions to assess mesa-wall surface integrity in advanced infrared detector arrays during fabrication. The technology must detect surface defects in small-pixel geometries for Sb-based and MCT detectors across MWIR/LWIR bands, enabling real-time process optimization and higher-yield production for military sensor platforms.